Sammenhengen mellom mikrofeil i optiske aktive elementer og sammenbrudd under testing

Offentlig prosjektsammendrag

Microfail is devoted to understanding the effect of micro fails and defects on any observed issue like cracks, delamination, corrosion, moisture absorption and haziness. Larger, more complex structures like OIS (Optical Image Stabelizer) are most likely more sensitive to these defects and it is important that we are able to control them. Samples are selected from our product test programs (Not a part of this project) and made in controlled experiments due to time temperature and environment. All selected samples are analysed by SINTEF and NTNU and evaluated in cooperation with poLight scientists. A number analytical techniques will be used including destructive and non-destructive tests described in the project description. We may also need analytical instruments not available in Norway. Through our partners we may use facilities in SNRF, CERN and som other laboratories. Finally we will tune and adjust wafer processing parameters and assembly process to avoid or reduce the number of defects.